NOTABLE QUOTE
"Advanced, phased array SAM systems make it possible to move to a higher level of failure analysis because of the level of detection and precision involved. In the past, detecting a 500-µm defect was the goal; now it is a 50-µm defect. With this type of testing, we can inspect materials and discover flaws that were previously undetected." — Hari Polu, OKOS president.
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