For high speed, real-time phase noise measurements using sources that require high stability in demanding applications, the FSPN Phase Noise Analyzer and VCO Tester provides sensitivity, accuracy, and reliability. It was designed for production and design engineers who characterize sources such as synthesizers, VCOs, OCXOs, and DROs.
The FSPN comes in two models: one covers the frequency range from 1 MHz to 8 GHz and the other from 1 MHz to 26.5 GHz, addressing radar and satellite applications in the C band, X band, Ku band, and the complete K band. It shares tried-and-tested FSWP features such as low noise internal local oscillators coupled with real-time cross correlation engines for increased measurement sensitivity.
Cross-correlation sensitivity gains can be viewed in real-time in result traces, allowing users to adjust the trade-off between measurement speed and sensitivity to meet their application requirements. Users in production need just a few correlations to measure high-quality oscillators, synthesizers or VCOs with high throughput. Simultaneous device frequency and phase settling times can be measured with up to 8 GHz of real-time analysis bandwidth. To investigate oscillator long-term frequency stability, it calculates the Allan variance in the time domain at fixed intervals and uses phase noise measurements to apply cross-correlations and suppress spurs.
It is also equipped with three ultra-low-noise DC sources to supply and sweep VCOs. The built-in VCO characterization measurement mode analyzes VCO characteristics such as frequency, sensitivity, RF power or current draw versus tuning voltage. VCO harmonics can also be measured versus tuning voltage without an additional spectrum analyzer.
- Frequency range from 1 MHz to 8 GHz/26.5 GHz
- Very high sensitivity for phase noise measurements with dual synthesizers and cross-correlation included in the base unit, typ. –163 dBc (1 Hz) at 1 GHz carrier frequency and 10 kHz offset
- Extremely low?noise internal DC sources for automatic VCO characterization
- High measurement speed with hardware-implemented real-time cross-correlation
- Simultaneous measurement of phase noise and amplitude noise
