The EddyView II portable eddy current flaw detector features a large touchscreen display with gesture adjustments for key parameters such as gain and rotation, the ability to drive conventional probes or array probes, an independent channel that monitors probe-to-part coupling (liftoff), and UniWest’s signal performance with extremely low signal-to-noise. Also, its rugged housing is designed to meet the standards of Ingress Protection (IP) rating IP-65.
The EddyView II also includes multi-frequency probe drive and signal mixing, digital conductivity & non-conductive coating thickness, and compatibility with UniWest’s ECS-1S & JF-15 rotating bolt-hole scanners. In addition, the EddyView II can be connected to the internet for remote diagnostics and calibration, as well as export raw eddy current data for post-processing flexibility.
Designed for use by NDT professionals, the EddyView II includes all the advanced features and functionality to allow both standard eddy current measurements and complex inspections, including the use of eddy current array (ECA) probe up to 32 elements, as well as large-scale automated and robotic production applications. System features include multi-frequency with mixing, split-screen for both impedance plane and O-scope/sweep modes, digital conductivity measurement, non-conductive liftoff digital measurement, rotating scanner support for high-speed bolt-hole scanning, Ethernet connectivity, alarm outputs, and USB flash drive support. Ideal for field, laboratory or production settings, the EddyView II’s fast data acquisition rate facilitates smooth system integration.
- Touchscreen display with touch-gesture adjustments
- Industry-leading signal quality (low signal-to-noise)
- Independent channel monitors probe to part coupling
- Multi-frequency
- Conventional or array probes up to 32 coils
- Compatible with ECS-1S and JF-15 rotating scanners
- Conductivity and non-conductive coating thickness
- Multiple display modes including impedance plane, C-scan, O-scope, and strip chart
- Exportable raw data for post-processing flexibility
